Finite state machine implementation with single-electron tunneling technology

Proceedings - IEEE Computer Society Annual Symposium on Emerging VLSI Technologies and Architectures 2006

Volumn 2006, Issue , 2006, Pages 237-241

  Mi, Jialin ^a   Chen, Chunhong ^a  

^a UNIVERSITY OF WINDSOR   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRON TUNNELING; ENERGY DISSIPATION; FORMAL LOGIC; RADIO FREQUENCY AMPLIFIERS; SIGNAL ENCODING;

FINITE STATE MACHINES; RADIO-FREQUENCY IDENTIFICATION (RFID) SYSTEMS; SINGLE-ELECTRON ENCODED LOGIC (SEEL); SINGLE-ELECTRON TUNNELING (SET);

FINITE AUTOMATA;

EID: 33749319758     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISVLSI.2006.45     Document Type: Conference Paper

References (15)

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