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Volumn 320, Issue 1-3, 2003, Pages 143-150

TEM investigation on the structure of amorphous silicon monoxide

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; PHASE INTERFACES; PHASE SEPARATION; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037409945     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(03)00029-2     Document Type: Article
Times cited : (146)

References (18)
  • 10
    • 0001545743 scopus 로고
    • Energy-filtering transmission electron microscopy
    • Berlin: Springer
    • Reimer L. Energy-filtering Transmission Electron Microscopy. Springer Ser. in Opt. Sci. vol. 71:1995;Springer, Berlin.
    • (1995) Springer Ser. in Opt. Sci. , vol.71
    • Reimer, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.