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Volumn 320, Issue 1-3, 2003, Pages 143-150
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TEM investigation on the structure of amorphous silicon monoxide
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON SCATTERING;
PHASE INTERFACES;
PHASE SEPARATION;
STRUCTURE (COMPOSITION);
TRANSMISSION ELECTRON MICROSCOPY;
ELECTRON SPECTROSCOPIC IMAGING (ESI);
PAIR DISTRIBUTION FUNCTIONS (PDF);
AMORPHOUS SILICON;
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EID: 0037409945
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(03)00029-2 Document Type: Article |
Times cited : (146)
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References (18)
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