Fabrication and characterization of high-resolution AFM tips with high-quality double-wall carbon nanotubes

Chemical Physics Letters

Volumn 429, Issue 4-6, 2006, Pages 581-585

  Kuwahara, Shota ^a   Akita, Seiji ^b   Shirakihara, Masashi ^a   Sugai, Toshiki ^a   Nakayama, Yoshikazu ^b   Shinohara, Hisanori ^a,c  

^a NAGOYA UNIVERSITY   (Japan)

^b Osaka Prefecture University   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; CARBON NANOTUBES; ELECTRIC DISCHARGES; HIGH TEMPERATURE APPLICATIONS; SCANNING ELECTRON MICROSCOPY;

DOUBLE WALL CARBON NANOTUBES (DWNT); HIGH TEMPERATURE DISCHARGES; NANOMATERIALS;

ATOMIC FORCE MICROSCOPY;

EID: 33748681495     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2006.08.045     Document Type: Article

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