Nanoindentation on carbon thin films obtained from a C 60 ion beam

Applied Surface Science

Volumn 252, Issue 22, 2006, Pages 8005-8009

  Dall'Asen A G ^a,b   Verdier, M ^c   Huck, H ^a,d   Halac, E B ^a,d   Reinoso, M ^a,d  

^a DEPARTAMENTO DE FÍSICA   (Argentina)

^b Facultad de Ciencias Naturales e Instituto M Lillo   (Argentina)

^c UNIV GRENOBLE ALPES   (France)

^d UNIVERSIDAD NACIONAL DE SAN MARTÍN   (Argentina)

Author keywords

AFM; C 60 fullerene; Ion beam deposition; Nanoindentation; Raman spectroscopy; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; ELASTIC MODULI; FULLERENES; ION BEAMS; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY;

CARBON THIN FILMS; NANOINDENTATION TECHNIQUE; SILICON SUBSTRATES;

THIN FILMS;

EID: 33748596067     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.10.008     Document Type: Article

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