The effect of fluence on the hardening of C60 films irradiated with He and N ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 148, Issue 1-4, 1999, Pages 634-638

  Foerster, C E ^a   Serbena, F C ^a   Lepienski, C M ^b   Baptista, D L ^c   Zawislak, F C ^c  

^a STATE UNIVERSITY OF PONTA GROSSA   (Brazil)

^b FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^c FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

Amorphization; Fullerene; Hardness; Ion irradiation; Young modulus

Indexed keywords

AMORPHIZATION; DEPOSITION; ELASTIC MODULI; FULLERENES; HARDNESS; HELIUM; ION BOMBARDMENT; MECHANICAL VARIABLES MEASUREMENT; NITROGEN; RAMAN SPECTROSCOPY; SILICON WAFERS; THIN FILMS;

NANOINDENTATION TESTS;

AMORPHOUS FILMS;

EID: 0033513781     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00800-3     Document Type: Article

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