메뉴 건너뛰기




Volumn 24, Issue 5, 2006, Pages 1823-1830

High-rate plasma-deposited SiO2 films for surface passivation of crystalline silicon

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION; DEPOSITION; PASSIVATION; REFRACTIVE INDEX; SILICA; SILICON; THIN FILMS;

EID: 33748579050     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2232580     Document Type: Article
Times cited : (46)

References (42)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.