Electron-induced H atom desorption patterns created with a scanning tunneling microscope: Implications for controlled atomic-scale patterning on H-Si(1 0 0)

Surface Science

Volumn 600, Issue 16, 2006, Pages

  Tong, Xiao ^a   Wolkow, Robert A ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Electron stimulated desorption; Hydrogen; Nanopatterning; Scanning tunneling microscopy; Silicon

Indexed keywords

CHEMICAL BONDS; DIMERS; ELECTRON SCATTERING; HYDROGEN; SCANNING TUNNELING MICROSCOPY; SILICON;

DANGLING BOND (DB) CLUSTERS; ELECTRON STIMULATED DESORPTIONS; NANOPATTERNING; SPATIAL LOCALIZATION;

DESORPTION;

EID: 33748203723     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.06.038     Document Type: Article

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