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Physical Review Letters

Volumn 88, Issue 4, 2002, Pages 461041-461044

Real-space study of the pathway for dissociative adsorption of H2 on Si(001)

(5) Darr M a Hu, Z a Biedermann, A a Hafer U b Heinz, T F a

a Columbia University ^* (United States)

b PHILIPPS UNIVERSITY MARBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DESORPTION; DIMERS; DISSOCIATION; HYDROGEN; REACTION KINETICS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE REACTIONS; THERMAL EFFECTS;

DISSOCIATIVE ADSORPTION;

GAS ADSORPTION;

EID: 0037185598 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (53)

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