Critical thickness for dislocation generation during ferroelectric transition in thin film on a compliant substrate

Applied Physics Letters

Volumn 89, Issue 8, 2006, Pages

  Zheng, Yue ^a,b   Wang, Biao ^a,c   Woo, C H ^b  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^c SUN YAT SEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTROMAGNETIC WAVE POLARIZATION; FERROELECTRICITY; PHASE TRANSITIONS; THERMAL STRESS;

DISLOCATION GENERATION; FERROELECTRIC TRANSITION; FORMATION ENERGY; LANDAU-DEVONSHIRE FORMALISM;

FERROELECTRIC THIN FILMS;

EID: 33747866000     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2338515     Document Type: Article

References (16)

1. S. P. Alpay, I. B. Misirlioglu, V. Nagarajan, and R. Ramesh, Appl. Phys. Lett. 85, 2044 (2004).
2. S. Y. Hu, Y. L. Li, and L. Q. Chen, J. Appl. Phys. 94, 2542 (2003).
3. D. Zubia, S. D. Hersee, and T. Khraishi, Appl. Phys. Lett. 80, 740 (2002).
4. J. W. Matthews and A. E. Blakeslee, J. Cryst. Growth 27, 118 (1974).
5. R. People and J. Bean, Appl. Phys. Lett. 47, 118 (1985).
6. L. B. Freund and W. D. Nix, Appl. Phys. Lett. 69, 173 (1996).
7. Tong-Yi Zhang, Sanboh Lee, L. J. Guido, and Chun-Hway Hsueh, J. Appl. Phys. 85, 7579 (1999).
8. Tong-Yi Zhang and Yan-Jing Su, Appl. Phys. Lett. 74, 1689 (1999).
9. G. Kastner and U. Gosele, J. Appl. Phys. 88, 4048 (2000).
10. H. Yin, K. D. Hobart, F. J. Kub, S. R. Shieh, T. S. Duffy, and J. C. Sturm, Appl. Phys. Lett. 82, 3853 (2003).
11. Y. Zheng, B. Wang, and C. H. Woo, Appl. Phys. Lett. 88, 092903 (2006).
12. N. A. Pertsev, A. G. Zembilgotov, and A. K. Tagantsev, Phys. Rev. Lett. 80, 1988 (1998).
13. S. Choudhury, Y. L. Li, C. E. Krill III, and L. Q. Chen, Acta Mater. 53, 5313 (2005).
14. S. P. Timoshenko and J. N. Goodier, Theory of Elasticity, 3rd ed. (McGraw-Hill, 1973).
15. B. Wang and C. H. Woo, J. Appl. Phys. 97, 084109 (2005).
16. B. Wang, C. H. Woo, Q. P. Sun, and T. X. Yu, Philos. Mag. 83, 3753 (2003).