The critical thickness of an epilayer deposited on a semiconductor-on-insulator compliant substrate

Applied Physics Letters

Volumn 74, Issue 12, 1999, Pages 1689-1691

  Zhang, Tong Yi ^a   Su, Yan Jing ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; ELECTRIC INSULATORS; FILM GROWTH; FOURIER TRANSFORMS; SUBSTRATES;

SEMICONDUCTOR-ON-INSULATOR COMPLIANT SUBSTRATES;

SEMICONDUCTING FILMS;

EID: 0032614368     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123656     Document Type: Article

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