Critical thickness for dislocation generation in epitaxial piezoelectric thin films

Philosophical Magazine

Volumn 83, Issue 31-34, 2003, Pages 3753-3764

  Wang, Biao ^a,c   Woo, C H ^a   Sun, Qingping ^b   Yu, T X ^b  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^c HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); ELASTIC MODULI; EPITAXIAL GROWTH; EXTRAPOLATION; FREE ENERGY; PIEZOELECTRIC MATERIALS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING ALUMINUM COMPOUNDS; STRAIN; THICKNESS MEASUREMENT;

CRYSTALLOGRAPHIC ANISOTROPY; LATTICE MISMATCH; PIEZOELECTRIC THIN FILMS;

THIN FILMS;

EID: 0346960922     PISSN: 14786435     EISSN: None     Source Type: Journal    
DOI: 10.1080/14786430310001600196     Document Type: Conference Paper

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