Criteria for formation of interface dislocations in a finite thickness epilayer deposited on a substrate

Journal of Applied Physics

Volumn 85, Issue 11, 1999, Pages 7579-7586

  Zhang, Tong Yi ^a   Lee, Sanboh ^b   Guido, L J ^c   Hsueh, Chun Hway ^d  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c Yale University   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001100876     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370558     Document Type: Article

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