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Modern Physics Letters B

Volumn 20, Issue 17, 2006, Pages 1049-1058

Nanostructure and properties of indium tin oxide (ITO) films produced by electron beam evaporation

(3) Pokaipisit, Artorn a Udomkan, Nitinai a Limsuwan, Pichet a

a KING MONGKUT'S UNIVERSITY OF TECHNOLOGY THONBURI (Thailand)

Author keywords

Atomic force microscopy; Evaporation; Indium tin oxide

Indexed keywords

EID: 33747850471 PISSN: 02179849 EISSN: None Source Type: Journal
DOI: 10.1142/S0217984906011402 Document Type: Article

Times cited : (13)

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