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Volumn 14, Issue 5, 2006, Pages
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Molecular dynamics analysis for fracture behaviour of single crystal silicon thin film with micro notch
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Author keywords
[No Author keywords available]
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Indexed keywords
BOUNDARY CONDITIONS;
COMPUTER SIMULATION;
FRACTURE;
MOLECULAR DYNAMICS;
SINGLE CRYSTALS;
STRESS INTENSITY FACTORS;
LOADING DIRECTION;
MICRO NOTCH;
NOTCH DEPTH;
THIN FILMS;
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EID: 33747707596
PISSN: 09650393
EISSN: 1361651X
Source Type: Journal
DOI: 10.1088/0965-0393/14/5/S09 Document Type: Article |
Times cited : (20)
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References (32)
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