Thermal characterization of tungsten thin films by pulsed photothermal radiometry

Nanoscale and Microscale Thermophysical Engineering

Volumn 10, Issue 4, 2006, Pages 333-344

  Martan, J ^a,b   Semmar, N ^a   Boulmer Leborgne, C ^a   Plantin, P ^a   Le Menn, E ^a  

^a UNIVERSITÉ D'ORLÉANS   (France)

^b UNIVERSITY OF WEST BOHEMIA   (Czech Republic)

Author keywords

Pulsed laser; Pulsed photothermal radiometry; Surface temperature; Thermal properties; Thin films; Tungsten

Indexed keywords

CALIBRATION; CHARACTERIZATION; HEAT TRANSFER; RADIOMETRY; THERMAL CONDUCTIVITY; THIN FILMS;

HEAT TRANSFER EQUATION; PHOTOTHERMAL RADIOMETRY; THERMAL CONTACT RESISTANCES;

TUNGSTEN COMPOUNDS;

EID: 33747493950     PISSN: 15567265     EISSN: None     Source Type: Journal    
DOI: 10.1080/15567260601009189     Document Type: Article

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