Thin-film thermophysical property characterization by scanning laser thermoelectric microscope

International Journal of Thermophysics

Volumn 19, Issue 2 SPEC.ISS., 1998, Pages 557-567

  Borca Tasciuc, T ^a   Chen, G ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Photothermal method; Scanning laser; Thermal conductivity; Thermal diffusivity; Thermoelectric effect; Thin film

Indexed keywords

EVAPORATION; HEAT CONDUCTION; LASER BEAMS; MICROSCOPES; THERMAL CONDUCTIVITY; THERMAL DIFFUSION; THERMOELECTRIC EQUIPMENT; THIN FILMS; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; SUBSTRATES; THERMOCOUPLES; THERMOELECTRICITY; TRANSPARENCY;

GOLD FILMS; PHOTOTHERMAL METHODS; SCANNING LASERS; PHOTOTHERMAL METHOD; SCANNING LASER THERMOELECTRIC MICROSCOPE;

THERMODYNAMIC PROPERTIES; THERMAL DIFFUSION IN SOLIDS;

EID: 0032023341     PISSN: 0195928X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022586032424     Document Type: Article

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