Improvements of on-membrane method for thin film thermal conductivity and emissivity measurements

Sensors and Actuators, A: Physical

Volumn 117, Issue 2, 2005, Pages 203-210

  Jacquot, A ^a   Chen, G ^b   Scherrer, H ^a   Dauscher, A ^a   Lenoir, B ^a  

^a CNRS   (France)

^b Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Emissivity; Measurement; Thermal conductivity; Thermoelectricity; Thin films

Indexed keywords

EMISSIVITY; ROOM TEMPERATURE; SILICON LAYERS; THERMOLECTRIC MATERIALS;

CERAMIC MATERIALS; COMPUTER SIMULATION; ELECTROMAGNETIC WAVES; HEAT TRANSFER; MEASUREMENT THEORY; MEMBRANES; POLYSILICON; REFRACTIVE INDEX; THERMOELECTRICITY; THIN FILMS;

THERMAL CONDUCTIVITY;

EID: 69749086712     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2004.06.013     Document Type: Article

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