The interfacial structures of (Ba, Sr)TiO 3 films deposited by radio frequency magnetron sputtering

Applied Surface Science

Volumn 252, Issue 20, 2006, Pages 7407-7414

  Liao, J X ^a   Yang, C R ^a   Zhang, J H ^a   Fu, C L ^a   Chen, H W ^a   Leng, W J ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

BST; Dielectric properties; Interfacial structures; Perovskite; Transition layer

Indexed keywords

BARIUM COMPOUNDS; CRYSTALLIZATION; CURRENT DENSITY; INTERFACES (MATERIALS); MAGNETRON SPUTTERING; PEROVSKITE; RAPID THERMAL ANNEALING; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

BST; INTERFACIAL STRUCTURES; TRANSITION LAYER;

THIN FILMS;

EID: 33747155345     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.08.073     Document Type: Article

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