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Volumn 24, Issue 2, 2004, Pages 271-276

(Ba,Sr)TiO3 thin film growth in a batch processing MOCVD reactor

Author keywords

BaTiO3 and titanates; Capacitors; Dielectric properties; Electron microscopy; Thin films

Indexed keywords

CHEMICAL REACTORS; EVAPORATION; FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERMITTIVITY; SOLUTIONS; THIN FILMS;

EID: 0346724196     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00235-8     Document Type: Article
Times cited : (18)

References (7)
  • 2
    • 0035872897 scopus 로고    scopus 로고
    • High-K dielectrics: Current status and materials problems
    • Wilk G.D. Wallace R.M. Anthony J.M. High-K dielectrics: Current status and materials problems J. Appl. Phys. 89 2001 5243 5275
    • (2001) J. Appl. Phys. , vol.89 , pp. 5243-5275
    • Wilk, G.D.1    Wallace, R.M.2    Anthony, J.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.