Near-field Raman spectroscopy using a tetrahedral SNOM tip

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6195, Issue , 2006, Pages

  Klein, Stefan ^a   Reichert, Joachim ^a   Fuchs, Harald ^a   Fischer, Ulrich ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Raman spectroscopy; Scanning near field optical microscopy; Tip enhanced Raman spectroscopy

Indexed keywords

DATA REDUCTION; MOLECULAR SPECTROSCOPY; SCANNING; SURFACE PLASMON RESONANCE;

LARGE FIELD ENHANCEMENT; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; TIP ENHANCED RAMAN SPECTROSCOPY (TERS);

RAMAN SPECTROSCOPY;

EID: 33746732978     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.662561     Document Type: Conference Paper

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