Nanoscale deformation and cracking studies of advanced metal evaporated magnetic tapes using atomic force microscopy and digital image correlation techniques

Materials Science and Technology

Volumn 22, Issue 7, 2006, Pages 835-844

  Li, Xiaodong ^a   Xu, Weijie ^a   Sutton, M A ^a   Mello, M ^b  

^a University of South Carolina   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

Atomic force microscopy; Deformation; Digital image correlation; Magnetic tapes

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACK INITIATION; DEFORMATION; IMAGE PROCESSING; POLYETHYLENE TEREPHTHALATES; TENSILE STRENGTH;

DIGITAL IMAGE CORRELATION; NANOSCALE DEFORMATION; STRAIN DISTRIBUTION; TENSILE LOADING;

MAGNETIC TAPE;

EID: 33746612034     PISSN: 02670836     EISSN: None     Source Type: Journal    
DOI: 10.1179/174328406X101283     Document Type: Article

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