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Journal of Materials Research

Volumn 16, Issue 3, 2001, Pages 844-855

In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy

(2) Bobji, M S a Bhushan, Bharat a

a Ohio State University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; ELASTICITY; MAGNETIC TAPE; POLYMERS; STRAIN; TENSILE TESTING;

TENSILE DEFORMATION;

THIN FILMS;

EID: 0035295258 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2001.0110 Document Type: Article

Times cited : (34)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.