In situ study of nano-cracking in multilayered magnetic tapes under monotonic and fatigue loading using an AFM

Ultramicroscopy

Volumn 100, Issue 3-4, 2004, Pages 359-373

  Tambe, Nikhil S ^a   Bhushan, Bharat ^a  

^a Ohio State University   (United States)

Author keywords

07.79.Sp; 18; 62.20.Mk; 85.70.Kh; AFM; Cracking; Fatigue; Magnetic tapes; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; DEFORMATION; FAILURE ANALYSIS; FATIGUE TESTING;

ATOMIC FORCE MICROSCOPY (AFM); FAILURE MECHANSIMS; NANO-CRACK FORMATION;

MAGNETIC TAPE;

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; ELASTICITY; MATERIAL COATING; MATERIALS; MATHEMATICAL MODEL; NANOTECHNOLOGY; PREDICTION; SAMPLE; TAPE RECORDER; TENSILE STRENGTH;

EID: 3042615207     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2003.10.006     Document Type: Conference Paper

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