Submicron deformation field measurements: Part 1. Developing a digital scanning tunneling microscope

Experimental Mechanics

Volumn 38, Issue 1, 1998, Pages 18-23

  Vendroux, G ^a   Knauss, W G ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CORRELATION METHODS; DEFORMATION; DIGITAL SIGNAL PROCESSING; FEATURE EXTRACTION; IMAGE ANALYSIS; IMAGE QUALITY; IMAGE UNDERSTANDING; SCANNING TUNNELING MICROSCOPY; TENSILE TESTING;

DIGITAL IMAGE CORRELATION METHODS;

COMPOSITE MICROMECHANICS;

EID: 0032022532     PISSN: 00144851     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02321262     Document Type: Article

References (17)

1. Binnig, G., Rohrer, H., Gerber, C., and Weibel, E., "Tunneling Through a Controllable Vacuum Gap," Appl. Phys. Lett., 40, 178-180 (1982).
2. Sutton, M.A., Walters, W.J., Peters, W.H., Ranson, W.F., and McNeil, S.R., "Determination of Displacements Using an Improved Digital Correlation Method," Image Vision Computing, 1 (3), 133-139 (1983).
3. Sutton, M.A., Cheng, M., Peters, W.H., Chao, Y.J., and McNeil, S.R., "Application of an Optimized Digital Image Correlation Method to Planar Deformation Analysis," Image Vision Computing, 4 (3), 143-150 (1986).
4. Sutton, M.A., McNeil, S.R., Jang, J., and Babai, M., "Effects of Subpixel Image Restoration on Digital Correlation Error-Estimates," Opt. Eng., 27 (10), 870-877 (1988).
5. Bruck, H.A., McNeil, S.R., Sutton, M.A., and Peters, W.H., "Digital Image Correlation Using Newton-Raphson Method of Partial Differential Correction," EXPERIMENTAL MECHANICS, 29 (3), 261-267 (1989).
6. Chu, T.C., Ranson, W.F., Sutton, M.A., and Peters, W.H., "Applications of Digital Image Correlation Techniques to Experimental Mechanics," EXPERIMENTAL MECHANICS, 25 (3), 232-244 (1985).
7. Vendroux, G. and Knauss, W.G., "Submicron Deformation Field Measurements: Part 2. Improved Digital Image Correlation," EXPERIMENTAL MECHANICS, forthcoming.
8. Vendroux, G., "Scanning Tunneling Microscopy in Micromechanics Investigations," Doctoral thesis, GALCIT Report SM93-36, California Institute of Technology, Pasadena (1994).
9. Vendroux, G. and Knauss, W.G., "Deformation Measurements at the Sub-micron Size Scale I: Design of a Digital Scanning Tunneling Microscope," GALCIT Report SM94-4a, California Institute of Technology, Pasadena (1994).
10. Vendroux, G. and Knauss, W.G., "Deformation Measurements at the Sub-micron Size Scale II: Refinements in the Algorithm for Digital Image Correlation," GALCIT Report SM94-5, California Institute of Technology, Pasadena (1994).
11. Vendroux, G. and Knauss, W.G., "Deformation Measurements at the Sub-micron Size Scale III: Deformation Mechanisms in a Structural Polymer," GALCIT Report SM94-6, California Institute of Technology, Pasadena (1994).
12. Schmid, N. and Knauss, W.G., "Deformation Measurements at the Sub-micron Size Scale IV: Application to Composite Micromechanics," GALCIT Report SM95-8a, California Institute of Technology, Pasadena (1995).
13. Fowler, R.H. and Nordheim, L., "Electron Emission in Intense Electric Field" Proc. Roy. Soc. London, A119, 173-180 (1928).
14. Simmons, J.G., "Generalized Formula for the Electric Tunnel Effect Between Similar Electrodes Separated by a Thin Insulating Film," J. Appl. Phys., 34, 1793-1803 (1963).
15. Binnig, G. and Smith, D.P.E., "Single Tube Three-dimensional Scanner for Scanning Tunneling Microscopy," Rev. Sci. Instr., 57 (8) 1688-1689 (1986).
16. Burleigh Instrument Inc., Micropositioning Systems Catalog, Fishers, NY (1990).
17. Vendroux, G. and Knauss, W.G., "Submicron Deformation Field Measurements: Part 3. Demonstration of Deformation Determinations," EXPERIMENTAL MECHANICS, forthcoming.