메뉴 건너뛰기




Volumn 2005, Issue , 2005, Pages 39-44

Volume effect on the soldering reaction between SnAgCu solders and Ni

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); COPPER; NICKEL; SOLDERED JOINTS; SOLDERING; TIN ALLOYS;

EID: 33746530002     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAPM.2005.1432042     Document Type: Conference Paper
Times cited : (32)

References (18)
  • 1
    • 0037076832 scopus 로고    scopus 로고
    • Six cases of reliability study of Pb-free solder joints in electronic packaging technology
    • K. Zeng, and K. N. Tu, Materials Science and Engineering, "Six cases of reliability study of Pb-free solder joints in electronic packaging technology," R 38, pp.55-105, 2002.
    • (2002) Materials Science and Engineering , vol.R 38 , pp. 55-105
    • Zeng, K.1    Tu, K.N.2
  • 2
    • 33746502424 scopus 로고    scopus 로고
    • Republic of China patent 1490961 23 March
    • C. R. Kao, and C. E. Ho, Republic of China patent 1490961 (23 March 2001).
    • (2001)
    • Kao, C.R.1    Ho, C.E.2
  • 3
    • 0035455523 scopus 로고    scopus 로고
    • Kinetics of Aucontaining ternary intermetallic redeposition at solder/UBM interface
    • J. H. Lee, J. H. Park, D. H. Shin, Y. H. Lee, and Y. S. Kim, Journal of Electronic Materials, "Kinetics of Aucontaining ternary intermetallic redeposition at solder/UBM interface," vol. 30, pp.1138-1144, 2001.
    • (2001) Journal of Electronic Materials , vol.30 , pp. 1138-1144
    • Lee, J.H.1    Park, J.H.2    Shin, D.H.3    Lee, Y.H.4    Kim, Y.S.5
  • 5
    • 0036209651 scopus 로고    scopus 로고
    • Strong effect of Cu concentration on the reaction between lead-free microelectronic solders and Ni
    • March
    • C. E. Ho, Y. L. Lin, and C. R. Kao, Chemistry of Materials, "Strong effect of Cu concentration on the reaction between lead-free microelectronic solders and Ni," vol. 14, pp.949-951, March 2002.
    • (2002) Chemistry of Materials , vol.14 , pp. 949-951
    • Ho, C.E.1    Lin, Y.L.2    Kao, C.R.3
  • 6
    • 0036610410 scopus 로고    scopus 로고
    • Effect of Cu concentration on the reactions between Sn-Ag-Cu solders and Ni
    • C. E. Ho, R. Y. Tsai, Y. L. Lin, and C. R. Kao, Journal of Electronic Materials, "Effect of Cu concentration on the reactions between Sn-Ag-Cu solders and Ni," vol. 31, pp.584-590, 2002.
    • (2002) Journal of Electronic Materials , vol.31 , pp. 584-590
    • Ho, C.E.1    Tsai, R.Y.2    Lin, Y.L.3    Kao, C.R.4
  • 7
    • 0036665776 scopus 로고    scopus 로고
    • Interfacial reactions between lead-free SnAgCu solder and Ni(P) surface finish on printed circuit boards
    • July
    • K. Zeng, V. Vuorinen, and J. K. Kivilahti, IEEE Transactions on Electronics packaging manufacturing, "Interfacial reactions between lead-free SnAgCu solder and Ni(P) surface finish on printed circuit boards," vol. 25, pp.162-167, July 2002.
    • (2002) IEEE Transactions on Electronics Packaging Manufacturing , vol.25 , pp. 162-167
    • Zeng, K.1    Vuorinen, V.2    Kivilahti, J.K.3
  • 8
    • 18644381608 scopus 로고    scopus 로고
    • Reactions between Sn-Ag- Cu lead-free solders and the Au/Ni surface finish in advanced electronic packages
    • L. C. Shiau, C. E. Ho, and C. R. Kao, Soldering and Surface Mount Technology, "Reactions between Sn-Ag- Cu lead-free solders and the Au/Ni surface finish in advanced electronic packages," vol. 14/3, pp.25-29, 2002.
    • (2002) Soldering and Surface Mount Technology , vol.14 , Issue.3 , pp. 25-29
    • Shiau, L.C.1    Ho, C.E.2    Kao, C.R.3
  • 9
    • 0036612341 scopus 로고    scopus 로고
    • Aspects of the structural evolution of lead-free solder joints
    • June
    • A. Zribi, R. Kinyanjui, P. Borgesen, L. Zavalij, and E. J. Cotts, JOM, "Aspects of the structural evolution of lead-free solder joints," vol. 54, pp.38-40, June 2002.
    • (2002) JOM , vol.54 , pp. 38-40
    • Zribi, A.1    Kinyanjui, R.2    Borgesen, P.3    Zavalij, L.4    Cotts, E.J.5
  • 11
    • 0037463944 scopus 로고    scopus 로고
    • Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints
    • K. S. Kim, S. H. Huh, and K. Suganuma, Journal of Alloys and Compounds, "Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints," vol. 352, pp. 226-236, 2003.
    • (2003) Journal of Alloys and Compounds , vol.352 , pp. 226-236
    • Kim, K.S.1    Huh, S.H.2    Suganuma, K.3
  • 12
    • 0344495601 scopus 로고    scopus 로고
    • Effect of 0.5 wt% Cu in Sn-3.5% Ag solder on the interfacial reaction with Au/Ni metallization
    • M. 0. Alam, Y. C. Chan, and K. N. Tu, Chemistry of Materials, "Effect of 0.5 wt% Cu in Sn-3.5% Ag solder on the interfacial reaction with Au/Ni metallization," vol. 15, pp.4340-4342, 2003.
    • (2003) Chemistry of Materials , vol.15 , pp. 4340-4342
    • Alam, M.O.1    Chan, Y.C.2    Tu, K.N.3
  • 13
    • 7044228178 scopus 로고    scopus 로고
    • Influence of Cu addition to interface microstructure between Sn-Ag solder and Au/Ni-6P plating
    • October
    • C. W. Hwang, K. Suganuma, M. Kiso, and S. Hashimoto, Journal of Electronic Materials, "Influence of Cu addition to interface microstructure between Sn-Ag solder and Au/Ni-6P plating," vol. 10, pp. 1200-1209, October 2004.
    • (2004) Journal of Electronic Materials , vol.10 , pp. 1200-1209
    • Hwang, C.W.1    Suganuma, K.2    Kiso, M.3    Hashimoto, S.4
  • 14
    • 0036477472 scopus 로고    scopus 로고
    • Effect of Cu concentration on the interfacial reaction between Ni and Sn-Cu solders
    • W. T. Chen, C. E. Ho, and C. R. Kao, Journal of Material Research, "Effect of Cu concentration on the interfacial reaction between Ni and Sn-Cu solders," vol. 17, pp.263-265, 2002.
    • (2002) Journal of Material Research , vol.17 , pp. 263-265
    • Chen, W.T.1    Ho, C.E.2    Kao, C.R.3
  • 15
    • 0141816576 scopus 로고    scopus 로고
    • Effect of supersaturation of Cu on reaction and intermetallic compound formation between Sn-Cu solder and thin film metallization
    • September
    • J. S. Ha, T. S. Oh, and K. N. Tu, Journal of Material Research, "Effect of supersaturation of Cu on reaction and intermetallic compound formation between Sn-Cu solder and thin film metallization," vol. 18, pp.2109-2114, September 2003.
    • (2003) Journal of Material Research , vol.18 , pp. 2109-2114
    • Ha, J.S.1    Oh, T.S.2    Tu, K.N.3
  • 16
    • 33746537120 scopus 로고    scopus 로고
    • October
    • Japan Electronics and Information Technology Industries Association (JEITA) Lead-Free Roadmap Project, October 2002.
    • (2002) Lead-Free Roadmap Project
  • 17
    • 33746581106 scopus 로고    scopus 로고
    • (M. S. Thesis, National Tsing-Hua University, Taiwan), June
    • C. H. Lin (M. S. Thesis, National Tsing-Hua University, Taiwan), June 2001.
    • (2001)
    • Lin, C.H.1
  • 18
    • 0001145935 scopus 로고
    • Thermal and electrical properties of copper-tin and nickel-tin intermetallics
    • October
    • H. P. R. Frederikse, R. J. Fields, and A. Feldman, Journal of Applied Physics, "Thermal and electrical properties of copper-tin and nickel-tin intermetallics," vol. 72, pp.2879-2822, October 1992.
    • (1992) Journal of Applied Physics , vol.72 , pp. 2879-12822
    • Frederikse, H.P.R.1    Fields, R.J.2    Feldman, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.