Characterization of interfaces and defects on the atomic scale with the conjuction of stem Z-contrast imaging and EELS

Ceramic Transactions

Volumn 191, Issue , 2006, Pages 171-186

  Fu, L F ^b   Browning, N D ^b   Kundaliya, D C ^a   Zhang, S X ^a   Ramadan, W ^a   Venkatesan, T ^a   Ogale, S B ^a  

^a Bldg 142   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

HETEROINTERFACE SYSTEMS; OXIDES INTERFACE SYSTEMS; SCANNING TRANSMISSION ELECTRON MICROSCOPES (STEM);

CERAMIC MATERIALS; CHARACTERIZATION; COMPUTER SIMULATION; ELECTRONIC STRUCTURE; IMAGING TECHNIQUES; MICROSTRUCTURE; PHYSICAL PROPERTIES; STRONTIUM; TRANSMISSION ELECTRON MICROSCOPY;

INTERFACES (COMPUTER);

EID: 33746084494     PISSN: 10421122     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

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