Electrical characteristics and chemical stability of non-oxidized, methyl-terminated silicon nanowires

Journal of the American Chemical Society

Volumn 128, Issue 28, 2006, Pages 8990-8991

  Haick, Hossam ^a   Hurley, Patrick T ^a   Hochbaum, Allon I ^b   Yang, Peidong ^b,c   Lewis, Nathan S ^a  

^a California Institute of Technology   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; SILICON;

ARTICLE; CONDUCTANCE; ELECTRICITY; ELECTRODE; MATERIAL COATING; MOLECULAR STABILITY; OXIDATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33746050921     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja056785w     Document Type: Article

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