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Volumn 352, Issue 28-29, 2006, Pages 3134-3139
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XPS study of pulsed Nd:YAG laser oxidized Si
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Author keywords
Laser matter interactions; Lasers; Silicon; XPS
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Indexed keywords
ANNEALING;
MICROSTRUCTURE;
NEODYMIUM;
OXIDATION;
SILICON;
STOICHIOMETRY;
SUBSTRATES;
THERMAL EFFECTS;
X RAY PHOTOELECTRON SPECTROSCOPY;
DECOMPOSITION TECHNIQUE;
FILM STRUCTURE;
LASER-MATTER INTERACTIONS;
SUBOXIDES;
NEODYMIUM LASERS;
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EID: 33745877188
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2006.03.063 Document Type: Article |
Times cited : (18)
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References (24)
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