Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films

Journal of Applied Physics

Volumn 92, Issue 11, 2002, Pages 6762-6767

  Li, Y ^a   Nagarajan, V ^a   Aggarwal, S ^a   Ramesh, R ^a   Salamanca Riba, L G ^a   Martinez Miranda L J ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN BOUNDARIES; LATTICE CONSTANTS; LEAD COMPOUNDS; PULSED LASER APPLICATIONS; X RAY SCATTERING;

GRAZING INCIDENT X-RAY SCATTERING (GIXS);

FERROELECTRIC MATERIALS;

EID: 0036904076     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1513195     Document Type: Article

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