In-depth RBS study of optical layers based on nanostructured silicon

Journal of Non-Crystalline Solids

Volumn 352, Issue 23-25, 2006, Pages 2521-2525

  Torres Costa, V ^a   Martin Palma R J ^a   Paszti, F ^b,c   Climent Font, A ^a,b   Martinez Duart J M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^c WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

Author keywords

Defects; Nanocrystals; Nanoparticles; Optical spectroscopy; Porosity; Rutherford backscattering

Indexed keywords

CURRENT DENSITY; DEFECTS; NANOSTRUCTURED MATERIALS; OPTOELECTRONIC DEVICES; POROSITY; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

NANOCRYSTALS; NANOPARTICLES; OPTICAL SPECTROSCOPY; RUTHERFORD BACKSCATTERING;

POROUS SILICON;

EID: 33745416526     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.03.040     Document Type: Article

References (21)

1. Bisi O., Ossicini S., and Pavesi L. Surf. Sci. Rep. 38 (2000) 1
2. Lehmann V. Electrochemistry of Silicon: Instrumentation, Science, Materials and Applications (2002), Wiley-VCH, Weinheim
3. Cullis A.G., and Canham L.T. Nature (London) 353 (1991) 335
4. Lehmann V., Jobst B., Muschik T., Kux A., and Petrova-Koch V. Jpn. J. Appl. Phys. 32 (1993) 2095
5. Liu W., Xie X., Zhang M., Shen Q., Lin C., Wang L., and Chu P.K. J. Vac. Sci. Technol. B 21 1 (2003) 168
6. Young I.M., Beale M.I.J., and Benjamin J.D. Appl. Phys. Lett. 46 12 (1985) 1133
7. Maehama T., Afuso C., and Itoh N. Jpn. J. Appl. Phys. 37 (1998) 998
8. Bellet D., and Dolino G. Phys. Rev. B 50 23 (1994) 17162
9. Manotas S., Agulló-Rueda F., Moreno J.D., Martín-Palma R.J., Guerrero-Lemus R., and Martínez-Duart J.M. Appl. Phys. Lett. 75 7 (1999) 977
10. Martín-Palma R.J., Pascual L., Herrero P., and Martínez-Duart J.M. Appl. Phys. Lett. 81 1 (2002) 25
11. Martín-Palma R.J., Pascual L., Landa A., Herrero P., and Martínez-Duart J.M. Appl. Phys. Lett. 85 13 (2004) 2517
12. Kótai E. Nucl. Instrum. Meth. Phys. Res., Sect. B 85 (1994) 588
13. Pászti F., and Szilágyi E. Vacuum 50 1-3 (1998) 451
14. Grosman A., Ortega C., Siejka J., and Chamarro M. J. Appl. Phys. 74 3 (1993) 1992
15. Torres-Costa V., Paszti F., Climent-Font A., Martín-Palma R.J., and Martínez-Duart J.M. Electrochem. Solid-State Lett. 7 11 (2004) G244
16. Torres-Costa V., Pászti F., Climent-Font A., Martín-Palma R.J., and Martínez-Duart J.M. Phys. Status Solidi C 2 9 (2005) 3208
17. Torres-Costa V., Paszti F., Climent-Font A., Martín-Palma R.J., and Martínez-Duart J.M. J. Electrochem. Soc. 152 11 (2005) G846
18. Bruggeman D.A.G. Ann. Phys. 24 (1935) 636
19. Bergman D.J. Phys. Rep. C 43 (1978) 377
20. Looyenga H. Physica 31 (1965) 401
21. Torres-Costa V., Martín-Palma R.J., and Martínez-Duart J.M. J. Appl. Phys. 96 8 (2004) 4197