Optical constants of porous silicon films and multilayers determined by genetic algorithms

Journal of Applied Physics

Volumn 96, Issue 8, 2004, Pages 4197-4203

  Torres Costa, V ^a   Martin Palma R J ^a   Martinez Duart J M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT DENSITY; DISPERSION (WAVES); GENETIC ALGORITHMS; INTERPOLATION; LIGHT ABSORPTION; LIGHT INTERFERENCE; LIGHT REFLECTION; MATHEMATICAL MODELS; MULTILAYERS; REFRACTIVE INDEX; SEMICONDUCTING FILMS; SILICON WAFERS; SPECTRUM ANALYSIS;

DOUBLE-BEAM SPECTROPHOTOMETERS; INTERFERENCE FILTERS; OPTICAL CONSTANTS; POROSITY LAYERS; SILICON FILMS;

POROUS SILICON;

EID: 7544242240     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1786672     Document Type: Article

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