Determination of the evolution of the surface potential of a charging insulator by measuring the intensity of its X-ray characteristic peaks

EPJ Applied Physics

Volumn 32, Issue 1, 2005, Pages 29-36

  Askri, B ^a,b   Renoud, R ^a   Raouadi, K ^b   Ganachaud, J P ^a  

^a UNIVERSITY OF NANTES   (France)

^b FACULTÉ DES SCIENCES DE TUNIS   (Tunisia)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; ELECTRIC VARIABLES MEASUREMENT; ELECTRON EMISSION; ELECTRON TRAPS; MONTE CARLO METHODS; X RAY ANALYSIS;

ELECTRONIC BOMBARDMENT; SPATIAL DISTRIBUTION; SURFACE POTENTIAL; X-RAY EMISSION;

ELECTRIC INSULATORS;

EID: 27844459402     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap:2005068     Document Type: Article

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