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Volumn 99, Issue 11, 2006, Pages

Structural investigations of Pt/TiOx electrode stacks for ferroelectric thin film devices

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); PIEZOELECTRIC TRANSDUCERS; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33745236033     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2202015     Document Type: Article
Times cited : (17)

References (27)
  • 15
    • 33745243517 scopus 로고    scopus 로고
    • PCTRF Multilayer Reflectivity Fitting Program (available on request).
    • U. Klemradt, PCTRF Multilayer Reflectivity Fitting Program (available on request).
    • Klemradt, U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.