X-ray diffraction investigation of self-annealing in nanocrystalline copper electrodeposits

Scripta Materialia

Volumn 55, Issue 4, 2006, Pages 283-286

  Pantleon, Karen ^a   Somers, Marcel A J ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Copper; Electroplating; Resistivity; Twinning; X ray diffraction

Indexed keywords

ANNEALING; COPPER; CRYSTALLINE MATERIALS; CRYSTALLOGRAPHY; NANOSTRUCTURED MATERIALS; TEXTURES; TWINNING; X RAY DIFFRACTION;

COPPER ELECTRODEPOSITS; CRYSTALLITES; RESISTIVITY; SELF-ANNEALING;

ELECTROPLATING;

EID: 33744909559     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2006.05.010     Document Type: Article

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