Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy

Review of Scientific Instruments

Volumn 77, Issue 5, 2006, Pages

  Jayanth, G R ^a   Jeong, Younkoo ^a   Menq, Chia Hsiang ^a  

^a Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC ACTUATION; OSCILLATION AMPLITUDE; TOPOGRAPHY;

ACTUATORS; ATOMIC FORCE MICROSCOPY; BANDWIDTH; FEEDBACK CONTROL; OSCILLATIONS; POSITION CONTROL; SCANNING;

AMPLITUDE MODULATION;

EID: 33744794899     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2200874     Document Type: Article

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