SiC-based optical interferometry at high pressures and temperatures for pressure and chemical sensing

Journal of Applied Physics

Volumn 99, Issue 9, 2006, Pages

  Dakshinamurthy, Surendramohan ^a   Quick, Nathaniel R ^b   Kar, Aravinda ^a  

^a University of Central Florida   (United States)

^b AppliCote Associates LLC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE SILICON CARBIDE; OXIDATION-RESISTANT PROPERTIES; SIC-BASED OPTICAL INTERFEROMETRY; WIRELESS TECHNIQUES;

COMBUSTION CHAMBERS; CRYSTALLINE MATERIALS; HIGH TEMPERATURE EFFECTS; INERT GASES; INTERFEROMETRY; MATHEMATICAL MODELS; OPTICAL ENGINEERING; OPTICAL SENSORS; OXIDATION; REFRACTIVE INDEX; SEMICONDUCTOR DEVICES; SILICON CARBIDE; TURBINES; WIRELESS TELECOMMUNICATION SYSTEMS;

CHEMICAL SENSORS;

EID: 33646880490     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2191478     Document Type: Article

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