Silicon-based surface plasmon resonance combined with surface-enhanced Raman scattering for chemical sensing

Review of Scientific Instruments

Volumn 68, Issue 6, 1997, Pages 2554-2557

  Nikitin, P I ^a   Beloglazov, A A ^a   Valeiko, M V ^a   Creighton, J A ^b   Wright, J D ^b  

^a PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

^b UNIVERSITY OF KENT   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; RAMAN SCATTERING; SEMICONDUCTOR DEVICE STRUCTURES; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE; SURFACE PHENOMENA;

PHOTOSIGNAL; SILICON BASED SURFACE PLASMON RESONANCE; STOKES FREQUENCY; SURFACE ENHANCED RAMAN SCATTERING;

SILICON SENSORS;

EID: 0031165110     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148160     Document Type: Article

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