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Volumn 1, Issue , 2005, Pages 192-197
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Yield driven gate sizing for coupling-noise reduction under uncertainty
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER AIDED DESIGN;
GATES (TRANSISTOR);
COUPLING NOISE;
FIXPOINT COMPUTATIONS;
GATE SIZING;
MANUFACTURING PROCESS;
PROBABILISTIC MODELS;
PROCESS VARIATION;
REDUCTION PROBLEM;
TRADITIONAL APPROACHES;
NOISE ABATEMENT;
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EID: 33646735266
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/1120725.1120803 Document Type: Conference Paper |
Times cited : (4)
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References (16)
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