High spatial resolution subsurface thermal emission microscopy

Applied Physics Letters

Volumn 84, Issue 22, 2004, Pages 4529-4531

  Ippolito, S B ^a   Thorne, S A ^a   Eraslan, M G ^a   Goldberg, B B ^a   Unlu M S ^a   Leblebici, Y ^b  

^a BOSTON UNIVERSITY   (United States)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMATIC ABERRATIONS; NUMERICAL APERTURE INCREASING LENSES (NAIL); SPATIAL RESOLUTION; THERMAL EMISSION MICROSCOPY;

ABERRATIONS; CAMERAS; CHARGE COUPLED DEVICES; ELECTRIC POTENTIAL; INFRARED IMAGING; INTEGRATED CIRCUITS; LIGHT POLARIZATION; MICROSCOPES; OPTICAL RESOLVING POWER; OPTIMIZATION; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SILICON;

OPTICAL INSTRUMENT LENSES;

EID: 3042825187     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1758308     Document Type: Article

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