Failure Analysis of Vertical Cavity Surface Emission Laser Diodes

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2003-November, Issue , 2003, Pages 426-430

  Siegelin, F ^a   Brillert, C ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE (MECHANICAL); LASER PULSES; SEMICONDUCTOR LASERS; SURFACE EMITTING LASERS;

CASE-STUDIES; ELECTRICAL CHARACTERIZATION; NANO-METER-SCALE; OPTICAL CHARACTERIZATION; OPTICAL OUTPUT; OXIDE CONFINED; PREPARATION METHOD; RAPID DEGRADATION; VERTICAL CAVITY SURFACE EMISSION LASERS; VERTICAL CAVITY SURFACE EMITTING LASER ARRAYS;

FAILURE ANALYSIS;

EID: 20844440623     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.31399/asm.cp.istfa2003p0426     Document Type: Conference Paper

References (7)

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3. R. W. Herrick, Degradation in Vertical Cavity Lasers, dissertation, Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA (1997)
4. D. T. Mathes et. al., Nanoscale materials characterization of degradation in VCSELs,. Proc. of SPIE, 4994-10, pp 67 - 83, 2003
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6. D. L. Barton, Optoelectronic Device Failure Analysis Techniques and Failure Modes, 28th ISTFA, Microelectronics Seminar, Nov. 2002
7. O. Ueda, Reliability and Degradation of III-V Optical Devices, pp. 75 - 78, Artech House Inc., Norwood, MA (1996)