Reliability study of 850 nm VCSELs for data communications

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1996, Pages 203-210

  Hawthorne III, Robert A ^a   Guenter, James K ^a   Granville, David N ^a   Hibbs Brenner, Mary K ^a   Morgan, Robert A ^a  

^a Honeywell's MICRO SWITCH Div   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; INTEGRATED CIRCUIT TESTING; RELIABILITY; STATISTICAL TESTS; SUBSTRATES;

RELIABILITY STUDY; VERTICAL CAVITY SURFACE EMITTING LASERS;

SEMICONDUCTOR LASERS;

EID: 0029709471     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1996.492120     Document Type: Conference Paper

References (13)