An atlas of ESD failure signatures in vertical cavity surface emitting lasers

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2005, Issue , 2005, Pages 336-343

  Mathes, D ^a   Guenter, J ^a   Hawkins, B ^a   Hawthorne, B ^a   Johnson, C ^a  

^a Advanced Optical Components   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC DISCHARGE (ESD); SURFACE EMITTING LASERS; VCSEL DEVICES; VERTICAL CAVITY SURFACE EMITTING LASERS (VCSELS);

ELECTRIC DISCHARGES; ELECTROSTATICS; ION BEAMS; LIGHT EMISSION; TRANSMISSION ELECTRON MICROSCOPY;

FAILURE ANALYSIS;

EID: 33645659054     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. D.T. Mathes, R. Hull, Kent Choquette, K. Geib, A. Allerman, J. Guenter, B. Hawkins, R. Hawthorne, "Nanoscale Materials Characterization of Degradation in VCSELs", Proc. of SPIE, vol. 4994, pp 67-83, (2003).
2. R. W. Herrick, Degradation in Vertical Cavity Lasers, Dissertation, Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA (1997).
3. R.W. Herrick, "Failure Analysis and Reliability of Optoelectronic Devices," published in "Microelectronics Failure Analysis Desk Reference, 5th ed.," by ASM International, Materials Park Ohio, pp. 230-254 (2004).
4. Terence J. Stark, Phillip E. Russell, and Corey Nevers, "3-D defect characterization using plan view and cross-sectional TEM / STEM analysis," to be published in the proceedings of ISTFA 2005 (this volume).
5. th International Symposium for Testing and failure Analysis, p. 426, 2003.
6. J. Krueger, R. Sabharwal, S. McHugo, K. Nguyen, N.X. Tan, N. Janda, M. Mayonte, M. Heidecker, D. Eastley, M. Keever, and C. Kocot, "Studies of ESD-related failure patterns of Agilent oxide VCSELs," Proc of SPIE, vol. 4994, pp. 162-172, (2003).
7. O. Mcateer, Electrostatic Discharge Control, (Mcgraw-Hill Publishing Company, 1990).
8. S. Voldman, ESD Physics and Devices, (John Wiley and Sons, 2004).
9. James K. Guenter, Jim A. Tatum, Robert A. Hawthorne III, Ralph H. Johnson, David T. Mathes, Bobby M. Hawkins, "A plot twist: the continuing story of VCSELs at AOC," Proc of the SPIE, vol 5737, pp. 20-34, (2005).