Nanoscale Materials Characterization of Degradation in VCSELs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4994, Issue , 2003, Pages 67-82

  Mathes, David T ^a   Hull, Robert ^b   Choquette, Kent ^c   Geib, Kent ^d   Allerman, Andy ^d   Guenter, Jim ^a   Hawkins, Bobby ^a   Hawthorne, Bobby ^a  

^a HONEYWELL   (United States)

^b University of Virginia   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Failure analysis; III V material degradation; Nanoscale characterization; VCSEL; Vertical Cavity Surface Emitting Lasers

Indexed keywords

DEGRADATION; DISLOCATIONS (CRYSTALS); LASER BEAMS; NANOSTRUCTURED MATERIALS; NUCLEATION; STRESS CONCENTRATION; TRANSMISSION ELECTRON MICROSCOPY;

POWER OUTPUT;

LASERS;

EID: 0141679374     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.482858     Document Type: Conference Paper

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