Unified model of femtosecond laser ionization in bulk solid dielectrics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6108, Issue , 2006, Pages

  Kudryashov, Sergey I ^a  

^a ARKANSAS STATE UNIVERSITY   (United States)

Author keywords

Ac stark and electronic bandgap renormalization; Auger recombination; Bulk solid dielectrics; Multi photon; Tunnel and avalanche ionization mechanisms; Ultrashort (femtosecond) laser pulses

Indexed keywords

CRYSTALLINE MATERIALS; IONIZATION; IRRADIATION; LASER APPLICATIONS; MATHEMATICAL MODELS; TRANSIENTS; ULTRAFAST PHENOMENA; ULTRASHORT PULSES;

AC-STARK AND ELECTRONIC BANDGAP RENORMALIZATION; AUGER RECOMBINATION; BULK SOLID DIELECTRICS; MULTI-PHOTON; TUNNEL AND AVALANCHE IONIZATION MECHANISMS; ULTRASHORT (FEMTOSECOND) LASER PULSES;

DIELECTRIC MATERIALS;

EID: 33646011533     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.646660     Document Type: Conference Paper

References (76)

1. K.M. Davis, K. Miura, N. Sugimoto, K. Hirao, Opt. Lett., 21, 1729, 1996;
2. C.B. Schaffer, A. Brodeur, J.F. Garcia, E. Mazur, Opt. Lett., 26, 93, 2001;
3. J.W. Chan, T. Huser, S. Risbud, D.M. Krol, Opt. Lett., 26, 1726, 2001;
4. G. Cerullo, R. Oselamme, S. Taccheo, M. Marangoni, D. Polli, R. Ramponi, P. Laporta, S. de Silvestri, Opt. Lett., 27, 1938, 2002;
5. S.-H. Cho, H. Kumagai, K Midorikawa, Appl. Phys. A, 76, 755, 2003;
6. A. Zoubir, C. Lopez, M. Richardson, K. Richardson, Opt. Lett., 29, 1840, 2004.
7. E.N. Glezer, E. Mazur: Appl. Phys. Lett., 71, 882, 1997;
8. C.B. Schaffer, A.O. Jamison, E. Mazur, Appl. Phys. Lett., 84, 1441, 2004;
9. M.H. Hong, B. Lik'yanchuk, S.M. Huang, T.S. Ong, L.H. Van, T.C. Chong, Appl. Phys. A, 79, 791, 2004;
10. S. Juodkazis, K. Yamasaki, V. Mizeikis, S. Matsuo, H. Misawa, Appl. Phys. A, 79, 1549, 2004.
11. D.J. Hwang, T.Y. Choi, C.P. Grigoropoulos, Appl. Phys. A, 79, 605, 2004;
12. S. Juodkazis, K. Yamasaki, V. Mizeikis, S. Matsuo, H. Misawa, Appl. Phys. A 79, 1549, 2004;
13. K. Sugioka, M. Masuda, T. Hongo, Y. Cheng, K. Shihoyama, K. Midorikawa, Appl. Phys. A, 79, 815, 2004;
14. K. Ke, E. Hasselbrink, A.J. Hunt, Proc. SPIE 5714, 53, 2005.
15. F. Korte, J. Serbin, J. Koch, A. Egbert, C. Fallnich, A. Ostendorf, B.N. Chichkov, Appl. Phys. A, 77, 229, 2003.
16. L.V. Keldysh, Sov. Phys. JETP, 20, 1307, 1965.
17. B.C. Stuart, M.D. Feit, S. Herman, A.M. Rubenchik, B.W. Shore, M.D. Perry, Phys. Rev. B, 53, 1749, 1996.
18. P. Martin, S. Guizard, Ph. Daguzan, G. Petite, P. D'Oliveira, P. Meynadier, M. Perdrix, Phys. Rev. B, 55, 5799, 1997.
19. F. Quere, S. Guizard, P. Martin, G. Petite, O. Gobert, P. Meynadier, M. Perdrix, Appl. Phys. B, 68, 459, 1999.
20. M. Lenzner, J. Kruger, S. Sartania, Z. Cheng, Ch. Spielmann, G. Mourou, W. Kautek, F. Krausz, Phys. Rev. Lett., 80, 4076, 1998.
21. M. Li, S. Menon, J.P. Nibarger, G.N. Gibson, Phys. Rev. Lett., 82, 2394, 1999.
22. D. Du, X. Liu, G. Korn, J. Squier, G. Mourou, Appl. Phys. Lett., 64, 3071, 1994.
23. A. Kaiser, B. Rethfeld, M. Vicanek, G. Simon, Phys. Rev. B, 61, 11437, 2000;
24. C.B. Schaffer, A. Brodeur, E. Mazur, Meas. Sci. Technol., 12, 1784, 2001.
25. D.M. Simanovskii, H.A. Schwettman, H. Lee, A.J. Welch, Phys. Rev. Lett., 91, 107601, 2003.
26. B. Rethfeld, Phys. Rev. Lett., 92, 187401, 2004.
27. A.P. Joglekar, H.Liu, E. Meyhofer, G. Mourou, A.J. Hunt, Proc. Nat. Acad. Sci., 101, 16, 5856, 2004.
28. M.D. Feit, A.M. Komashko, A.M. Rubenchik, Appl. Phys. A, 79, 1657, 2004.
29. V.E. Gruzdev, J. Opt. Technol., 71, 504, 2004.
30. S.S. Mao, F. Quere, S. Guizard, X. Mao, R.E. Russo, G. Petite, P. Martin, Appl. Phys. A, 79, 1695, 2004.
31. V.V. Temnov, K. Sokolowski-Tinten, P. Zhou, B. Rethfeld, V.E. Gruzdev, A. El-Khamawy, D. von der Linde, Proc. SPIE 5448, 1119, 2005.
32. M. Mero, J. Liu, W. Rudolph, D. Ristau, K. Starke, Phys. Rev. B, 71, 115109, 2005.
33. M. Mero, J. Sabbah, J. Zeller, W. Rudolph, Appl. Phys. A, 81, 317, 2005.
34. L.V. Keldysh, Sov. Phys JETP, 34, 788, 1958;
35. W. Franz, Z Naturforsch. Teil A, 13, 484, 1958
36. see also J.I. Pankove, Optical processes in semiconductors, Dover Publications, New York, 1971.
37. A.A. Manenkov, A.M. Prokhorov, Usp. Fiz. Nauk (Sov. Phys. Uspekhi), 148, 179, 1986 (in Russian).
38. S.C. Jones, P. Braunlich, R.T. Casper, X.-A. Shen, P. Kelly, Opt. Eng., 28, 1039, 1989.
39. A.Vogel, J. Noack, G. Hüttman, G. Paltauf, Appl. Phys. B, 81, 1015, 2005.
40. O. Madelung, Numerical data and functional relationships in science and technology, New series, Group III. Springer-Verlag, Berlin, 1982, V. 22a.
41. A.P. Joglekar, H.Liu, G.J. Spooner, E. Meyhofer, G. Mourou, A.J. Hunt, Appl. Phys. B, DOI 10.1007/s00340-003-1246-z, 2003.
42. S.I. Kudryashov, Boulder Damage Symposium XXXVII, 19-21 September 2005,
43. Proc. SPIE 5991 (2006, in print).
44. J.-Y. Bigot, M.T. Portella, R.W. Schoenlein, J.E. Cunningham, C.V. Shank, Phys. Rev. Lett., 67, 636, 1991.
45. P.Y. Yu, M. Cardona, Fundamentals of semiconductors, Springer, Berlin, 1999.
46. D. Arnold, D. Cartier, D.J. DiMaria, Phys. Rev. B, 45, 1477, 1992;
47. D. Arnold, D. Cartier, D.J. DiMaria, Phys. Rev. B, 49, 10278, 1994.
48. M. Combescot, R. Combescot, Phys. Rev. B, 35, 7986, 1987;
49. see also J.I. Pankove, Optical processes in semiconductors, Dover Publications, New York, 1971.
50. K.B. Nordstrom, K. Johnsen, S.J. Allen, A.-P. Jauho, B. Birnir, J. Kono, T. Noda, H. Akiyama, H. Sakaki, Phys. Rev. Lett., 81, 457, 1998;
51. C.J. Dent, B.N. Murdin, I. Galbraith, Phys. Rev. B 67, 165312, 2003.
52. G.W. Drake (Ed.), Atomic, molecular and optical physics handbook, AIP, New York, 1996, ch.72.
53. S.I. Kudryashov, Proc. SPIE 5448, 1171, 2004.
54. S.I. Kudryashov, in Conference on Lasers and Electro-optics/Quantum Electronics and Laser Science and Photonic Applications, Systems and technologies 2005 (Optical Society of America, Washington, DC, 2005), ISBN 1-55752-770-9, JThE26.
55. R. Fischer, R. Muller, Sov. Quant. Electronics, 16, 1723, 1989.
56. E.D. Palik, Handbook of Optical Constants of Solids, Academic Press, Orlando, 1998.
57. A.S. Epifanov, Sov. Phys. JETP, 40, 897, 1975;
58. B.G. Gorshkov, A.S. Epifanov, A.A. Manenkov, Sov. Phys. JETP, 49, 309, 1979;
59. M.V. Ammosov, N.B. Delone, V.P. Kraynov, Sov. Phys. JETP, 64, 1191, 1987.
60. S.I. Kudryashov, Proc. SPIE 5710, 120, 2005.
61. H.M. van Driel. Phys. Rev. B 35, 8166, 1987.
62. C.V. Shank, R.Yen, C. Hirliman, Phys. Rev. Lett. 51, 900, 1983.
63. W. Hayes, A.M. Stoneham, Defects and defect processes in nonmetallic solids, Wiley, New York, 1985;
64. R.T. Williams, Opt. Eng. 28, 1024, 1989.
65. E.J. Yoffa, Phys. Rev. B, 21, 2415, 1980.
66. S.I. Kudryashov, V.I. Emel'yanov, JETP, 94, 94, 2002.
67. A. Oschlies, R.W. Godby, R.J. Needs, Phys. Rev. B 45, 13741, 1992;
68. D.H. Kim, H. Ehrenreich, E. Runge, Sol. State. Commun. 89, 119, 1995;
69. C.D. Spataru, L.X. Benedict, S.G. Louie, Phys. Rev. B, 69, 205204, 2004.
70. C. Thomsen, H.T. Grahn, H.J. Maris, J. Taue, Phys. Rev. Lett., 34, 4129, 1986.
71. M. Kandyla, C. Roeser, E. Mazur, S.I. Kudryashov (to be published).
72. G.E. McGuire (Ed.), Characterization of semiconductor materials, Noyes publications, Park Ridge, 1989,
73. V.I; P. Nemec, P. Maly, M. Nikl, K. Nitsch, Appl. Phys. Lett., 76, 2850, 2000;
74. S. Marchetti, M. Martinelli, R. Simili, J. Phys.: Cond. Matt., 14, 3653, 2002.
75. G.A. Korn, T.M. Korn, Mathematical handbook for scientists and engineers, McGraw-Hill, New York, 1968.
76. A.P. Sutton, Electronic structure of materials, Clarendon Press, Oxford, 1993.