Ionization mechanisms in dielectrics irradiated by femtosecond laser pulses

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5448, Issue PART 2, 2004, Pages 1119-1126

  Temnov, V V ^a   Sokolowski Tinten, K ^a   Zhou, P ^a   Rethfeld, B ^a   Gruzdev, V E ^a   El Khamawy, A ^a   Von Der Linde, D ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Fs laser induced ionization of dielectrics; Time resolved interferometry

Indexed keywords

DYNAMICS; FOURIER TRANSFORMS; INTERFEROMETRY; IONIZATION; LASER BEAM EFFECTS; LASER PULSES; PHASE SHIFT; ULTRAFAST PHENOMENA;

FEMTOSECONDS; FS-LASER-INDUCED IONIZATION OF DIELECTRICS; TIME-RESOLVED INTERFEROMETRY;

DIELECTRIC MATERIALS;

EID: 11844273902     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.547145     Document Type: Conference Paper

References (8)

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