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Applied Physics Letters

Volumn 76, Issue 20, 2000, Pages 2850-2852

Auger recombination as a probe of the Mott transition in semiconductor nanocrystals

(4) Nemec P a Maly P a Nikl, M b Nitsch, K b

a CHARLES UNIVERSITY (Czech Republic)

b INSTITUTE OF PHYSICS (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347616406 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.126494 Document Type: Article

Times cited : (13)

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