Double-resonance probe for near-field scanning optical microscopy

Review of Scientific Instruments

Volumn 77, Issue 3, 2006, Pages

  Cherkun, A P ^a   Serebryakov, D V ^a   Sekatskii, S K ^a   Morozov, I V ^a   Letokhov, V S ^a  

^a INSTITUTE OF SPECTROSCOPY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BANDWIDTH; CANTILEVER BEAMS; OPTICAL MICROSCOPY; SENSORS; TRANSDUCERS;

SCANNING PROBE MICROSCOPES; SURFACE-CONTACT TRANSDUCER; VIBRATION AMPLITUDE;

RESONANCE;

EID: 33645839055     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2186386     Document Type: Article

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