Growth of (100)-oriented polycrystalline Si film by Ni-mediated crystallization of thin amorphous silicon

Journal of the Electrochemical Society

Volumn 153, Issue 1, 2006, Pages

  Oh, Jae Hwan ^a   Kim, Kyung Ho ^a   Kim, Eun Hyun ^a   Kim, Sang Kyu ^a   Jang, Jin ^a   Kang, Jun Yun ^b   Oh, Kyu Hwan ^b  

^a Kyung Hee University   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; BACKSCATTERING; CRYSTALLIZATION; DIFFRACTION; POLYCRYSTALLINE MATERIALS;

BACKSCATTERED DIFFRACTION PATTERN; POLYCRYSTALLINE SI FILM;

THIN FILMS;

EID: 33645511420     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2126583     Document Type: Article

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