Luminescence investigation of SiO2 surfaces damaged by 0.35 mm laser illumination

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3902, Issue , 2000, Pages 138-144

  Kozlowski, M R ^a   Battersby, C L ^a   Demos, S G ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CONTINUOUS WAVE LASERS; CRYSTAL DEFECTS; ELECTRON ENERGY LEVELS; FUSED SILICA; LASER BEAMS; LASER DAMAGE; LIGHT ABSORPTION; PHOTOLUMINESCENCE; SPECTROSCOPIC ANALYSIS; STOICHIOMETRY; ULTRAVIOLET RADIATION;

LASER ILLUMINATION; ULTRAVIOLET LASER-INDUCED DAMAGE;

OPTICAL GLASS;

EID: 0033904256     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)