Atomic-level analytical electron microscopy of diffusional phase transformations

Proceedings of an International Conference on Solid-Solid Phase Transformations in Inorganic Materials 2005

Volumn 2, Issue , 2005, Pages 431-442

  Watanabe, M ^a   Williams, D B ^a   Burke, M G ^b  

^a Lehigh University   (United States)

^b BECHTEL BETTIS INC   (United States)

Author keywords

(zeta) factor method; Elemental mapping; Multivariate statistical analysis; Quantitative X ray analysis; Spectrum imaging; Spherical aberration correction

Indexed keywords

COMPUTER HARDWARE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; MULTIVARIABLE SYSTEMS; STATISTICAL METHODS; THIN FILMS;

Ζ(ZETA)-FACTOR METHOD; ELEMENTAL MAPPING; MULTIVARIATE STATISTICAL ANALYSIS; QUANTITATIVE X-RAY ANALYSIS; SPECTRUM IMAGING; SPHERICAL ABERRATION CORRECTION;

PHASE TRANSITIONS;

EID: 33645212082     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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